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Reproducibility package for Measuring Exposure And Vulnerability To International Trade Shocks

2025
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Reference ID
RR_WLD_2025_424
DOI
https://doi.org/10.60572/a47x-as66
Author(s)
Jean-Christophe Maur, Jean-Francois Arvis, Akanksha Burman, Alvaro Espitia, Nadia Rocha, Daria Ulybina
Collections
World Bank Policy Research Working Papers
Metadata
JSON
Created on
Oct 10, 2025
Last modified
Oct 10, 2025
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Other Materials
README for the reproducibility package for Measuring Exposure And Vulnerability To International Trade Shocks
Download [PDF, 189.39 KB]
Reproducibility verification for Measuring Exposure And Vulnerability To International Trade Shocks
Download [PDF, 142.14 KB]
Reproducibility package for Measuring Exposure And Vulnerability To International Trade Shocks
Download [ZIP, 689.56 MB]
Download https://reproducibility.worldbank.org/index.php/catalog/363/download/1034
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data_hash_report.csv
LICENSE.txt
README.pdf
[0.0] master.do
[1.0] data.do
[2.0] indicators.do
ReadMe.txt
Eora26_columnn_balance.xlsx
Eora26_FDmatrix.xlsx
Eora26_Tmatrix.xlsx
Eora26_VAmatrix.xlsx
[0.0] master.do
[1.0] data.do
[2.0] indicators.do
ReadMe_ICIO_extended.xlsx
ReadMe_ICIO_Robjects for time series analysis.xlsx
ReadMe.txt
Figure2_Foreign_Exposure_VNM_Semiconductors.pdf
Figure2_Foreign_Exposure_VNM_Semiconductors.png
Figure3_Import_Dependency_VNM_Semiconductors.pdf
Figure3_Import_Dependency_VNM_Semiconductors.png
Figure4_Reliability_VNM_Semiconductors.pdf
Figure4_Reliability_VNM_Semiconductors.png
Figure5_Logistics_Complexity_VNM_Semiconductors.pdf
Figure5_Logistics_Complexity_VNM_Semiconductors.png
Figure6_usa_import_exposure.png
Figures 2-6 with graphs.xlsx
Figures 2-6.xlsx
Table 1_exposure_tables.xlsx
Table 2_exposure_tables.xlsx
2_Data_Cleaning_Trade_Data.do
egenmore.sthlp
stata.trk
_gadjl.ado
_gadju.ado
_gaxis.ado
_gbase.ado
_gbom.ado
_gbomd.ado
_gclsst.ado
_gcorr.ado
_gd2.ado
_gdayofyear.ado
_gdecimal.ado
_gdensity.ado
_gdhms.ado
_gegroup.ado
_gelap.ado
_gelap2.ado
_geom.ado
_geomd.ado
_gewma.ado
_gfilter.ado
_gfirst.ado
_gfoy.ado
_ggmean.ado
_ggroup2.ado
_ghmean.ado
_ghmm.ado
_ghmmss.ado
_ghms.ado
_gifirst.ado
_gilast.ado
_gincss.ado
_giso3166.ado
_glastnm.ado
_gminutes.ado
_gmixnorm.ado
_gmlabvpos.ado
_gmsub.ado
_gncyear.ado
_gnmiss.ado
_gnoccur.ado
_gnss.ado
_gntos.ado
_gnvals.ado
_gnwords.ado
_goutside.ado
_grall.ado
_grany.ado
_grcount.ado
_grecord.ado
_grepeat.ado
_gridit.ado
_grndint.ado
_grndsub.ado
_growmedian.ado
_grownvals.ado
_growsvals.ado
_grsum2.ado
_gseconds.ado
_gsemean.ado
_gsieve.ado
_gston.ado
_gsumoth.ado
_gtod.ado
_gtotal0.ado
_gtruncdig.ado
_gvar.ado
_gwordof.ado
_gwpctile.ado
_gwtfreq.ado
_gxtile.ado
[0.0] Master.do
[1.0] Programs.do
[2.0] Concordances.do
[3.0] Data_Preparation_Heuristic_Indicators_GVC_Exposure.do
[4.0] Data_Consolidation_GVC_Exposure.do
GVC_Exposure_Indicators.dta
Readme.txt
bilateral SC complexity LPI v2.pdf
heuristics all vars with exps October 2023.csv
stackedM.csv
stackedM1.csv
stackedN.csv
stackedN1.csv
stackedO.csv
stackedRcaM.csv
stackedRcaX.csv
stackedX.csv
stackedX1.csv
sc complexity output - bilateral weighted averages (REDUCED).csv
Concordance_HS_to_H0.CSV
HS 2012 to HS 1992 Correlation and conversion tables (1).xls
HS2017toHS1992ConversionAndCorrelationTables.xlsx
HS2017toHS1992_relation.dta
HS2017toHS2012ConversionAndCorrelationTables.xlsx
ISO3 concordance.dta
WB_Country_Classification_FY_25.dta
new_GVC_dataset.dta
HS_GVC_ProductGroup.xlsx
List of Products Semiconductors.xlsx
TAD-TC(2019)9-FINAL.en.pdf
Replication of Tables and Figures.do
README notes for SC Complexity.txt
bilateral sc complexity-checkpoint.ipynb
bilateral sc complexity.html
bilateral sc complexity.ipynb
bilateral sc complexity.pdf
c2c minus myanmar (calcs).xlsx
code_4_heuristic.xlsx
environment.yml
just heuristic countries.csv
results Travel Time and geo distance.csv
sc complexity output - bilateral weighted averages (REDUCED).csv
sc complexity output - bilateral weighted averages FULL.csv
sc_complexity_data_full.csv
sc_complexity_data_reduced.csv
unctad codes.csv
us_lsbci_21181766005401.xlsx
reproducibility_report_RR_WLD_2025_424.pdf
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